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Allen-Bradlev's study was performed on site using a
production assembly line with specially designed test
boards.
Component spacing, component orientation and pad sizes
on the boards were designed specifically to provoke
solder shorts.
The 23,8cm (9,4 in.) wide by 30,5cm (12 in.) long test
boards, contained:
- six axial lead components mounted next to vias,
- twelve 1206 components mounted next to clinched
leads,
- twenty 1206 components clustered transverse to board
travel,
- twenty four 1206 components clustered parallel to
board travel,
- twenty 1210 components clustered transverse to board
travel,
- twenty-two 1210 components clustered parallel to
board travel,
- ten 29-pin transverse-mounted SOIC components and
- eight transverse-mounted square-pin leaded connectors.
Five different liquid photoimageable solder masks were
selected to represent a wide spectrum of surface textures
as measured by percent gloss (mask F through H were
not used in this study)
The test boards were prepared at the solder mask manufacturer's
facility and submitted for assembly.
Some boards with solder mask A were given a UV bump
of 4'J/sq cm after thermal cure; others were not.
Surface mount components placed on the bottom sides
of the boards, and through-hole components were inserted
on the top sides.
Following surface mount component placement, the boards
passed through an adhesive cure infrared oven. After
through-hole component insertion, the boards were sent
through 1,1,1 trichloroethane solvent for two minutes
at 35°C (95°F), spray only.
Ten boards of each solder mask were wave soldered with
nitrogen cover gas using the following parameters:
preheat temperature, 127°C (260°F) ± 10 degrees:
solder
contact, two seconds; oxygen, less than 10 percent;
flux, 2 percent solids no clean.
The surface texture of each solder mask was then evaluated
by taking gloss measurements (Figure 1).
Meseran studies were
performed on mask A using under-cure, standard-cure
and over-cure conditions to see if there were changes
in the number of solder balls (Figure 3).
Meseran is the trade name for an instrument
that measures degree of cure for polymers using the evaporative
rate analysis technique.
Radioactive solvents are applied to the mask, then a flow
of nitrogen is passed between a counter and the mask's
surface.
Masks that are not cured will give a high count due to
absorption of the solvent, which is equated to a low cure
index. The lower the count, the higher the cure index.
Allen Bradley found no further significant decrease in
solder balls once the recommended standard optimum cure
was achieved. |